Detection and Classification of Plant Leaf Disease Using Local Directional Pattern and CNN

Authors

  • K. V. S. Ganesh, G. Sandhya Assistant Professor: Department of Electronics and Communication Engineering Avanthi Institute of Engineering and Technology, Tamaram, Makavarapalem, Anakapalle – 531113, Andhra Pradesh, India. Author
  • P. Sai Bhargavi, G. Tanmayee Satya, B. Gangadhar Author

Keywords:

Convolutional neural network, image classification, Kirsch edge detector, local binary pattern, local directional pattern, plant leaf disease detection, texture descriptor

Abstract

The detection of plant leaf diseases plays a pivotal role in advancing agricultural productivity. Traditional methods 
that rely on human expertise are being supplemented by artificial intelligence and computer vision. This paper applies 
a descriptor called the Local Directional Pattern (LDP) to improve feature generation from plant leaves for disease 
detection in apple crops. LDP uses Kirsch edge detectors to capture the textural and edge information of a leaf image, 
which is what distinguishes healthy specimens from diseased ones. Because edge responses are more stable than raw 
intensity values, the descriptor holds its pattern under noise and non-monotonic illumination change, which is a known 
weakness of the Local Binary Pattern it builds on. The descriptor is benchmarked against features derived from 
Convolutional Neural Networks (CNN) and the Histogram of Oriented Gradients (HOG). The system was 
implemented in Python using TensorFlow and Keras in the Spyder environment, and was trained and tested on the 
Plant Village dataset. It classifies apple leaves into four categories: healthy, cedar rust, scab and black rot. The results 
indicate that LDP is a reliable feature extraction tool for the agricultural sector, supporting crop management and 
apple yield prediction, and that combining edge-based descriptors with machine learning classifiers is a direction 
worth further exploration. 

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Published

2024-05-29

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Section

Articles

How to Cite

K. V. S. Ganesh, G. Sandhya, & P. Sai Bhargavi, G. Tanmayee Satya, B. Gangadhar. (2024). Detection and Classification of Plant Leaf Disease Using Local Directional Pattern and CNN . INTERNATIONAL JOURNAL OF MANAGEMENT RESEARCH AND REVIEW, 14(3), 157-166. https://ijmrr.com/index.php/ijmrr/article/view/749